Solar Metrology is a global leader in high-performance X-Ray Fluorescence (XRF) analysis systems. Solar Metrology XRF tools are specifically engineered for the demanding thin film measurement requirements of the Solar Electric and Power Storage industries.

  Our core focus is delivering production-ready XRF analysis tools for composition and thickness measurement of thin film depositions used in the manufacture of photovoltaics, power storage devices and other energy-related products.

  We offer a comprehensive line of XRF thin film analysis systems, ideally suited for research and process development, in-process monitoring and post-process quality control.

  At Solar Metrology, our commitment is to you...

                          ...the Next Generation Energy Provider.

CORPORATE HEADQUARTERS
101-5 Colin Drive
Holbrook, New York, USA 11714
Tel: 631.419.6246
Fax: 631.472.2424
www.solarmetrology.com
info@solarmetrology.com