FOR IMMEDIATE RELEASE

In-Line CIG, CIGS, CIGSSe and CdTe PV Panel Film Composition Analysis and Thickness Measurement

HOLBROOK, NY - Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, expands its portfolio of System SMX thin film composition and thickness measurement tools with the introduction of model SMX-ILH.

SMX-ILH is designed for in-line composition and thickness control of CIGS and CdTe photovoltaic thin film depositions. It offers a full (600 x 1200 mm) lateral range of measurement and can be inserted into printed, electrochemical and thermal film deposition processes.

SMX-ILH provides process control for active, contact and TCO layers in PV thin film stacks and is capable of analyzing rigid glass, flexible stainless steel and polyimide roll-to-roll substrates. A proprietary thermal shield option allows for film control at panel temperatures of up to 300 degrees Celsius.

Featuring fast and repeatable Copper-to-Gallium ratio determination with both cross-web and cross-panel gradient analysis capability,
SMX-ILH enables PV panel manufacturers to realize significant yield improvements and conversion efficiency gains in production.

Solar Metrology's SMX Measurement System provides a production-ready suite of thin film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.

Solar Metrology is a global leader in the development and manufacture of high-performance X-Ray Fluorescence (XRF) analysis tools, specifically engineered to meet the demanding thin film measurement requirements of the solar electric and renewable power industries.

To find out more, visit www.solarmetrology.com/products or contact info@solarmetrology.com

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