System SMX-ILH/FPV  
 


Console XRF Thin Film Composition and Thickness Measurement Systems

System SMX-ILH/FPV (for "Full Panel View") console XRF tool enables solar photovoltaics manufacturers to measure large rigid substrates (such as full glass solar PV panels) as well as reel-to-reel foil output from coil coating machines.

The SMX-ILH/FPV x-ray head can be precisely maneuvered in three axes, enabling detailed analysis of specific substrates at multiple locations, making SMX-ILH/FPV an ideal solution for offline sampling of in-process or finished product.


GENERAL SPECIFICATIONS (Subject to change)

 
 
 Dimensions
Console (Exterior): H 87" (220cm)
W 84" (215cm) D 95"(240cm)
 Weight 1200 lb (545 kg)
 X-Ray Generation Microfocus Be window x-ray tube, 50W
  Available 75W generation column
 Collimation Motorized, programmable collimator palette with six (6) collimators. Circular and rectangular geometries available.

(Single collimator configuration available.)
 Primary Filter
Up to five (5) available
 X-Ray Detection Silicon PIN Detector
(Available Silicon Drift (SDD) Detector)
Digital Signal Pulse Processing
Sample Positioning

LED Sample Lighting
  Contrast Auto-Focus
(with camera-based systems)
  Laser Triangulation Focus
(with camera-based systems)
Stage/X-Ray Head Positioning Motorized, programmable 3-axis (X-Y-Z) head positioning system.

Range (X-Y):
(0.6m x 1.2m) or (1.1m x 1.4m)

Range (Z):
150mm
 Options

SDD Detection Column Upgrade Package

Control Rack with Light Pole
 Software Solar Metrology MIRA XRF software package with FP Analysis, Data Transfer Protocol, Ethernet
 
 
 

 
 
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Introducing SYSTEM SMX - The world's most powerful XRF thickness and composition measurement tool for thin film Solar PV process control
   System SMX-ILH/FPV
    Console Full Panel XRF Analysis Tool
System SMX-FPV
 
System SMX-ILH Product Guide
This eight-page brochure provides detailed product information and specifications for the Solar Metrology SMX-ILH platform.

>> Download System SMX-ILH Brochure
      (PDF, 4MB)