SYSTEM SMX-BEN

Benchtop XRF Composition and Thickness
Measurement Tools

  An economical choice for R&D, process development
and failure analysis.

  Rapid, non-destructive composition analysis and
thickness measurement on virtually any material.

  Delivers applications versatility and unsurpassed
measurement performance in a compact form factor;

  An enabling technology for CIGS process development
and support. Typical applications include: Mo thickness;
all CIGS combinations (including pre-selenzation CIG
alloys and/or film combinations and final CIGS formulations);
CdS and related buffer layers.

  Facilitates material selection and recipe formulation in
pre- or early production ramp phase; will continue to support
your SMX production tool platforms well into capacity production.



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